From March 11 to 14, 2025, the International Congress of Metrology CIM 2025 was held in Lyon, France.

At this congress, a poster was presented by Boban Zarkov, metrologist for optical quantities at the Directorate for Measures and Precious Metals, and Dr. Veljko Zarubica, technical director of the accredited laboratory Analysis doo. This poster presents a new type of material that can be used as a certified reference material for the calibration of analytical instruments, spectrophotometers in the UV range, as well as nano drop spectrophotometers. The material was characterized, including short-term and long-term stability, homogeneity, temperature dependence and measurement uncertainty budget.

Publication of this work in scientific journals is planned in the coming months.